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Electron microprobe analysis and scanning electron microscopy in geology

S. J. B. Reed · 1996

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Now fully updated to cover recent developments, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms an up-to-date text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

המשפט הראשון: The atom can be represented by the Rutherford-Bohr model, in which negative electrons orbit around a positively charged nucleus.

פרטי הספר

שנה
1996
שפה
English
הוצאה
Cambridge University Press
מהדורות
4
עמודים
206
ISBN
9780521848756

מקור הנתונים: Wikidata

עוד של S. J. B. Reed