Exploring scanning probe microscopy with mathematica

This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the.

שנה

2007

שפה

English

הוצאה

Wiley-VCH

מהדורות

1

עמודים

310

ISBN

9783527609871

מקור הנתונים: Wikidata