R. K. Leach

Fundamental principles of engineering nanometrology
R. K. Leach · 2010
על הספר
Fundamental Principles of Engineering Nanometrology provides a comprehensive overview of engineering metrology and how it relates to micro and nanotechnology (MNT) research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume that can be used for professional reference and academic study.
פרטי הספר
- שנה
- 2010
- שפה
- English
- סדרה
- Micro and nano technologies
- הוצאה
- William Andrew
- מהדורות
- 1
- ISBN
- 9780080964546
מקור הנתונים: Wikidata
