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Handbook of Charged Particle Optics

Jon Orloff · 2008

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על הספר

"With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution-focused probe instruments." "The book's unique approach covers both the theoretical and practical knowledge of high-resolution probe-forming instruments. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field's cutting-edge technologies with added insight into how they work." "Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high-resolution probe instrumentation." --Book Jacket.

פרטי הספר

שנה
2008
שפה
English
הוצאה
CRC
מהדורות
2
עמודים
665
ISBN
9781420045543

מקור הנתונים: Wikidata

עוד של Jon Orloff