
Handbook of Charged Particle Optics
Jon Orloff · 2008
על הספר
"With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution-focused probe instruments." "The book's unique approach covers both the theoretical and practical knowledge of high-resolution probe-forming instruments. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field's cutting-edge technologies with added insight into how they work." "Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high-resolution probe instrumentation." --Book Jacket.
פרטי הספר
- שנה
- 2008
- שפה
- English
- הוצאה
- CRC
- מהדורות
- 2
- עמודים
- 665
- ISBN
- 9781420045543
מקור הנתונים: Wikidata



