High resolution electron microscopy of defects in materialsRobert Sinclair

High resolution electron microscopy of defects in materials

Robert Sinclair, David J. Smith (undifferentiated) · 1990

איפה לקנות

המחיר באמזון משתנה מדי יום, אז הכי נכון לראות אותו שם ברגע הקנייה.

לצפייה באמזון

פרטי הספר

שנה: 1990
שפה: English
הוצאה: Materials Research Society
מהדורות: 2
עמודים: 391
ISBN: 9781558990722

מקור הנתונים: Wikidata

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