Nanoscale Characterization of Surfaces and Interfaces

Derived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The techniques are described in terms of the physics and the technology of the methods and many high-quality images demonstrate the power of these techniques in the investigation of surfaces and the processes which occur on them. Topics include: STM, AFM, semiconductor surfaces and interfaces, insulators, layered compounds, charge density wave systems, superconductors, electrochemistry at liquid-solid interfaces, biological systems, metrological applications, nanoscale surface forces, nanotribology, and manipulation on the nanoscale. Materials scientists, surface scientists, electrochemists, as well as scientists working in catalysis and microelectronics will find this book an invaluable source of information. Inclusion of introductory material makes the book suitable also for graduate students and newcomers to the field.

שנה

1994

שפה

English

הוצאה

Vch Pub

מהדורות

3

עמודים

173

ISBN

9783527292479

מקור הנתונים: Wikidata