Reliability Analysis and Plans for Successive TestingN. Balakrishnan

Reliability Analysis and Plans for Successive Testing

N. Balakrishnan, Markos Koutras, Fotios Milienos · 2021

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פרטי הספר

שנה: 2021
שפה: English
הוצאה: Elsevier Science & Technology Books
מהדורות: 1
עמודים: 312
ISBN: 9780128043622

מקור הנתונים: Wikidata

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