Scanning probe microscopies

Materials science, especially electronics, continues its miniaturization trend from the scale of microns to nanometers-- thanks to scanning tunneling microscopy (STM) technology, which integrates measurement and fabrication in a single step. The authors, for whom no affiliation is listed, overview the history, physical basis, applications, and impact on next-generation electronics of STM and related microscopies. This concise volume includes instrument photos and images. Lacks an index. c. Book News Inc.

שנה

2001

שפה

English

הוצאה

Trans Tech Publications

מהדורות

3

עמודים

94

ISBN

9780878498680

מקור הנתונים: Wikidata