Scanning Probe Microscopy in Nanoscience and Nanotechnology 3

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

שנה

2013

שפה

English

סדרה

NanoScience and Technology

הוצאה

Springer Berlin Heidelberg

מהדורות

3

עמודים

630

ISBN

9783642254147

מקור הנתונים: Wikidata