X-Ray Diffraction by Disordered Lamellar Structures

New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.

שנה

1990

שפה

English

הוצאה

Springer Berlin Heidelberg

מהדורות

1

עמודים

371

ISBN

9783642748042

מקור הנתונים: Wikidata