Cher Ming Tan

Electromigration Modeling at Circuit Layout Level

Reliability and Failure Analysis of High Power LED Packaging

Reliability Analysis of Electrotechnical Devices

Graphene and VLSI Interconnects

Graphene and Ulsi Interconnects

Theory and Practice of Quality and Reliability Engineering in Asia Industry

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Electromigration in Ulsi Interconnections