IEEE International Workshop on Defect Based Testing (2000 Montréal, Québec)
2000 IEEE International Workshop on Defect Based Testing
IEEE International Workshop on Defect Based Testing (2000 Montréal, Québec), Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon · 2000
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- Year
- 2000
- Language
- English
- Publisher
- Institute of Electrical & Electronics Enginee
- Editions
- 1
- Pages
- 85
- ISBN
- 9780769506371
Data source: Wikidata