Advances in Metrology for X-Ray and EUV Optics IILahsen Assoufid

Advances in Metrology for X-Ray and EUV Optics II

Lahsen Assoufid, Peter Takacs, Masaru Ohtsuka · 2007

Where to buy

Amazon’s price changes daily, so the most accurate place to see it is there, at the moment you buy.

Book details

Year: 2007
Language: English
Publisher: SPIE
Editions: 1
Pages: 168
ISBN: 9780819468529

Data source: Wikidata

More by Lahsen Assoufid

Advances in Metrology for X-Ray and EUV Optics VILahsen Assoufid

Advances in Metrology for X-Ray and EUV Optics VI

Lahsen Assoufid · 2017

Advances in Metrology for X-Ray and EUV Optics VIILahsen Assoufid

Advances in Metrology for X-Ray and EUV Optics VII

Lahsen Assoufid · 2017

Advances in Metrology for X-Ray and EUV Optics VLahsen Assoufid

Advances in Metrology for X-Ray and EUV Optics V

Lahsen Assoufid · 2014

Advances in metrology for x-ray and EUV optics IIILahsen Assoufid

Advances in metrology for x-ray and EUV optics III

Lahsen Assoufid · 2010