Advances in scanning probe microscopyY. Watanabe
Advances in scanning probe microscopy
Y. Watanabe · 2000
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About the book
This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.
Book details
- Year
- 2000
- Language
- English
- Publisher
- Springer
- Editions
- 5
- Pages
- 341
- ISBN
- 9783540667186
Data source: Wikidata
