Elham Tabassi
Biometric Quality : the Last 1%
Elham Tabassi, Patrick Grother, U. S. Department of Commerce National Institute of Standards and Technology (NIST) · 2008
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- Year
- 2008
- Language
- English
- Publisher
- CreateSpace Independent Publishing Platform
- Editions
- 1
- Pages
- 68
- ISBN
- 9781495984501
Data source: Wikidata