booktheque

Characterization Methods of Submicron MOSFETs

Hisham Haddara · 1996

Where to buy

Amazon’s price changes daily, so the most accurate place to see it is there, at the moment you buy.

View on Amazon

This is an affiliate link: if you buy through it, the site earns a small commission at no extra cost to you, which helps us bring quality content and maintain the site. As an Amazon Associate we earn from qualifying purchases.

Book details

Year
1996
Language
English
Series
The International Series in Engineering and Computer Science
Publisher
Springer
Editions
1
Pages
248
ISBN
9780792396956

Data source: Wikidata

More by Hisham Haddara