CMOS and BiCMOS Process Integration and Device CharacterizationBadih El-Kareh

CMOS and BiCMOS Process Integration and Device Characterization

Badih El-Kareh · 2007

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Book details

Year: 2007
Language: English
Publisher: Springer
Editions: 1
Pages: 350
ISBN: 9780387367989

Data source: Wikidata

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