CMOS gate-stack scaling-- materials, interfaces and reliability implicationsAlexander A. Demkov
CMOS gate-stack scaling-- materials, interfaces and reliability implications
Alexander A. Demkov · 2009
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Book details
- Year
- 2009
- Language
- English
- Series
- MRS proceedings -- v. 1155
- Publisher
- Materials Research Society
- Editions
- 1
- Pages
- 179
- ISBN
- 9781605111285
Data source: Wikidata
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