Evan Russell

Data-driven methods for fault detection and diagnosis in chemical processes
Evan Russell, Evan L. Russell, Leo H. Chiang, Richard D. Braatz · 2000
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- Year
- 2000
- Language
- English
- Publisher
- Springer
- Editions
- 1
- Pages
- 192
- ISBN
- 9781852332587
Data source: Wikidata