Manoj Sachdev
Defect-oriented testing for nano-metric CMOS VLSI circuits
Manoj Sachdev, José Pineda de Gyvez · 2007
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- Year
- 2007
- Language
- English
- Publisher
- Springer
- Editions
- 5
- Pages
- 328
- ISBN
- 9780387465463
Data source: Wikidata
