Defects in HIgh-k Gate Dielectric StacksEvgeni Gusev

Defects in HIgh-k Gate Dielectric Stacks

Evgeni Gusev · 2006

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Book details

Year: 2006
Language: English
Publisher: Springer
Editions: 1
Pages: 492
ISBN: 9781402043666

Data source: Wikidata

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