Gettering and Defect Engineering in Semiconductor Technology VIICor Claeys
Gettering and Defect Engineering in Semiconductor Technology VII
Cor Claeys, Jan Vanhellemont, Hans Richter, Martin Kittler · 1997
Where to buy
Check today’s price on Amazon. We do not show prices because they change daily.
View on AmazonAffiliate link. As an Amazon Associate we earn from qualifying purchases.
Book details
- Year
- 1997
- Language
- English
- Publisher
- Trans Tech Publications, Limited
- Editions
- 1
- ISBN
- 9783035706710
Data source: Wikidata
More by Cor Claeys
Cryopreservation and freeze-drying protocolsCor Claeys
Cryopreservation and freeze-drying protocols
Cor Claeys · 2010
Metal Impurities in Silicon- and Germanium-Based TechnologiesCor Claeys
Metal Impurities in Silicon- and Germanium-Based Technologies
Cor Claeys · 2018
Germanium-Based TechnologiesCor Claeys
Germanium-Based Technologies
Cor Claeys · 2011
Extended Defects in GermaniumCor Claeys
Extended Defects in Germanium
Cor Claeys · 2010