booktheque

Integrated Circuit Metrology, Inspection, and Process Control VI

Michael T. Postek · 1992

Where to buy

Amazon’s price changes daily, so the most accurate place to see it is there, at the moment you buy.

View on Amazon

Book details

Year
1992
Language
English
Publisher
SPIE-International Society for Optical Engine
Editions
1
Pages
697
ISBN
9780819408280

Data source: Wikidata

More by Michael T. Postek

Critical Issues in Scanning Electron Microscope Metrology
Michael T. Postek · 1994
Integrated Circuit Metrology, Inspection, And Process Control VII
Michael T. Postek · 1993
Scanning Microscopies 2015
Michael T. Postek · 2015
Scanning Microscopies 2012
Michael T. Postek · 2012
Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors V
Michael T. Postek · 2011
New research in nanotechnology
Michael T. Postek · 2011
Scanning microscopies 2011
Michael T. Postek · 2011
Instrumentation, metrology, and standards for nanomanufacturing IV
Michael T. Postek · 2010
Scanning microscopy 2010
Michael T. Postek · 2010
Scanning microscopy 2009
Michael T. Postek · 2009