Materials Reliability Issues in MicroelectronicsJ. R. Llyod
Materials Reliability Issues in Microelectronics
J. R. Llyod, P. S. Ho, C. T. Fah, E. Yost · 1991
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Book details
- Year
- 1991
- Language
- English
- Publisher
- Materials Research Society
- Editions
- 1
- Pages
- 354
- ISBN
- 9781558991194
Data source: Wikidata