Enno Rey
Mehr IT-Sicherheit durch Pen-Tests
Enno Rey, Michael Thumann, Dominick Baier, Stephen Fedtke · 2012
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- Year
- 2012
- Publisher
- Vieweg+Teubner Verlag
- Editions
- 3
- Pages
- 218
- ISBN
- 9783322802583
Data source: Wikidata