Multi-Chip Module Test Strategies
Yervant Zorian · 1997
Where to buy
Check today’s price on Amazon. We do not show prices because they change daily.
View on AmazonAffiliate link. As an Amazon Associate we earn from qualifying purchases.
About the book
MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).
Book details
- Year
- 1997
- Language
- English
- Series
- Frontiers in Electronic Testing -- 7
- Publisher
- Springer US
- Editions
- 2
- Pages
- 167
- ISBN
- 9781461377986
Data source: Wikidata