Nanometer-Scale Defect Detection Using Polarized LightPierre-Richard Dahoo
Nanometer-Scale Defect Detection Using Polarized Light
Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami · 2016
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Book details
- Year
- 2016
- Language
- English
- Publisher
- Wiley & Sons, Incorporated, John
- Editions
- 4
- Pages
- 316
- ISBN
- 9781848219366
Data source: Wikidata
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