Noncontact Atomic Force Microscopy
S. Morita · 2002
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About the book
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
Book details
- Year
- 2002
- Language
- English
- Series
- NanoScience and Technology, 1434-4904
- Publisher
- Springer Berlin Heidelberg
- Editions
- 4
- Pages
- 439
- ISBN
- 9783642560194
Data source: Wikidata