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Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems

George Y. Baaklini, Norbert Meyendorf, Bernd Michel · 2002

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Book details

Year
2002
Publisher
SPIE Society of Photo-Optical Instrumentation Engi
Editions
1
Pages
238
ISBN
9780819444516

Data source: Wikidata

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