booktheque

Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '99

International Symposium on the Physical & Failure Analysis of Integrated Circuits (7th 1999 Singapore), IEEE Electron Devices Society, IEEE Reliability Society, IEEE Components Packaging & Manufacturin · 1999

Where to buy

Amazon’s price changes daily, so the most accurate place to see it is there, at the moment you buy.

View on Amazon

Book details

Year
1999
Language
English
Publisher
IEEE Standards Office
Editions
2
Pages
209
ISBN
9780780351882

Data source: Wikidata