Scanning probe microscopiesA. De Stefanis
Scanning probe microscopies
A. De Stefanis, A. A. G. Tomlinson · 2001
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About the book
Materials science, especially electronics, continues its miniaturization trend from the scale of microns to nanometers-- thanks to scanning tunneling microscopy (STM) technology, which integrates measurement and fabrication in a single step. The authors, for whom no affiliation is listed, overview the history, physical basis, applications, and impact on next-generation electronics of STM and related microscopies. This concise volume includes instrument photos and images. Lacks an index. c. Book News Inc.
Book details
- Year
- 2001
- Language
- English
- Publisher
- Trans Tech Publications
- Editions
- 3
- Pages
- 94
- ISBN
- 9780878498680
Data source: Wikidata