Surface Analysis Methods in Materials Science
D. John O'Connor · 1992
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About the book
This comprehensive and up-to-date guide to the use of surface analysis methods in materials science consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing fourteen surface methods and a separate section on applications. Each chapter is written by a specialist in the field. The surface methods described include SAM, XPS, SIMS and other ion beam methods, LEED/RHEED, RBS and NRA, FTIR, SEM, STM, UPS and magnetic methods. Among the areas of application discussed are adsorption, catalysis, coated steel surfaces, inorganic surfaces, semiconductor devices, thin film solar cells and high temperature oxidation. This detailed exposition will enable researchers to select and exploit the appropriate surface method for a given application.
Book details
- Year
- 1992
- Language
- English
- Series
- Springer Series in Surface Sciences -- 23
- Publisher
- Springer Berlin Heidelberg
- Editions
- 1
- Pages
- 453
- ISBN
- 9783662027691
Data source: Wikidata