Testing For Smalldelay Defects In Nanoscale Cmos Integrated CircuitsKrishnendu Chakrabarty

Testing For Smalldelay Defects In Nanoscale Cmos Integrated Circuits

Krishnendu Chakrabarty, Sandeep K. Goel · 2017

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Book details

Year: 2017
Language: English
Publisher: Taylor & Francis Group
Editions: 8
Pages: 259
ISBN: 9781315217819

Data source: Wikidata

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