VLSI test principles and architecturesLaung-Terng Wang

VLSI test principles and architectures

Laung-Terng Wang, Xiaoqing Wen, Cheng-Wen Wu · 2006

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Book details

Year: 2006
Language: English
Publisher: Morgan Kaufmann
Editions: 2
Pages: 808
ISBN: 9780123705976

Data source: Wikidata

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