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Waveguide spectroscopy of thin films

Alexander V. Khomchenko · 2005

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About the book

Considering measurement techniques of determination of the absorption coefficient, refractive index and thickness of the dielectric, this book presents methods of study of the linear and nonlinear optical properties of thin films. It is aimed at specialists in the fields of integrated and thin film optics and for graduates in related specialties.

Book details

Year
2005
Language
English
Series
Thin films and nanostructures -- v. 33
Publisher
Elsevier
Editions
1
Pages
220
ISBN
9780080457895

Data source: Wikidata