Pierre-Richard Dahoo
Applications and Metrology at Nanometer-Scale 2
Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami · 2021
פרטי הספר
- שנה
- 2021
- שפה
- English
- הוצאה
- Wiley & Sons, Incorporated, John
- מהדורות
- 4
- ISBN
- 9781119818960
מקור הנתונים: Wikidata
עוד של Pierre-Richard Dahoo
Pierre-Richard Dahoo

Infrared Spectroscopy of Symmetric and Spherical Spindles for Space Observation 1
Pierre-Richard Dahoo · 2021
Pierre-Richard Dahoo
Infrared Spectroscopy of Symmetric and Spherical Spindles for Space Observation, Volume 2
Pierre-Richard Dahoo · 2021
Pierre-Richard Dahoo
Applications and Metrology at Nanometer Scale 1
Pierre-Richard Dahoo · 2021
Pierre-Richard Dahoo
Infrared Spectroscopy of Triatomics for Space Observation
Pierre-Richard Dahoo · 2018
Pierre-Richard Dahoo
Infrared Spectroscopy of Diatomic for Space Observation
Pierre-Richard Dahoo · 2017
Pierre-Richard Dahoo
Infrared Spectroscopy of Diatomics for Space Observation
Pierre-Richard Dahoo · 2017
Pierre-Richard Dahoo
Nanometer-Scale Defect Detection Using Polarized Light
Pierre-Richard Dahoo · 2016