Cher Ming Tan

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou · 2013
פרטי הספר
- שנה
- 2013
- הוצאה
- Springer
- מהדורות
- 1
- עמודים
- 160
- ISBN
- 9781447126416
מקור הנתונים: Wikidata
עוד של Cher Ming Tan
Cher Ming Tan

Electromigration Modeling at Circuit Layout Level
Cher Ming Tan · 2013
Cher Ming Tan

Reliability and Failure Analysis of High Power LED Packaging
Cher Ming Tan · 2022
Cher Ming Tan

Reliability Analysis of Electrotechnical Devices
Cher Ming Tan · 2022
Cher Ming Tan
Graphene and VLSI Interconnects
Cher Ming Tan · 2021
Cher Ming Tan
Graphene and Ulsi Interconnects
Cher Ming Tan · 2021
Cher Ming Tan

Theory and Practice of Quality and Reliability Engineering in Asia Industry
Cher Ming Tan · 2017
Cher Ming Tan
Electromigration in Ulsi Interconnections
Cher Ming Tan · 2010