Patrick Echlin

Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Patrick Echlin, C. E. Fiori, Joseph Goldstein, David C. Joy · 1986
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- Year
- 1986
- Language
- German
- Publisher
- Springer US
- Editions
- 1
- ISBN
- 9781475790276
Data source: Wikidata


