booktheque

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Patrick Echlin, C. E. Fiori, Joseph Goldstein, David C. Joy · 1986

Where to buy

Amazon’s price changes daily, so the most accurate place to see it is there, at the moment you buy.

View on Amazon

Book details

Year
1986
Language
German
Publisher
Springer US
Editions
1
ISBN
9781475790276

Data source: Wikidata

More by Patrick Echlin