Advanced Scanning Electron Microscopy and X-Ray MicroanalysisPatrick Echlin

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Patrick Echlin, C.E. Fiori, Joseph Goldstein · 2013

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Book details

Year: 2013
Language: English
Publisher: Springer
Editions: 2
Pages: 466
ISBN: 9781475790290

Data source: Wikidata

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