Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors VMichael T. Postek

Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors V

Michael T. Postek, Victoria Anne Coleman · 2011

איפה לקנות

המחיר באמזון משתנה מדי יום, אז הכי נכון לראות אותו שם ברגע הקנייה.

לצפייה באמזון

פרטי הספר

שנה: 2011
שפה: English
סדרה: Proceedings of SPIE -- v. 8105
הוצאה: SPIE
מהדורות: 1
ISBN: 9780819487155

מקור הנתונים: Wikidata

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